TY - GEN
T1 - Characteristics of plasmonic resonance in a sandwiched metamaterial nano film
AU - Chiu, K. P.
AU - Tsai, D. P.
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2006
Y1 - 2006
N2 - We will investigate the surface plasmon (SP) resonances of a dielectric-sandwiched metamaterial film. The parameters of the metamaterial are chose so that it has both negative s and μ in visible frequency range. We use transfer matrix method to calculate the attenuated total reflection (ATR) spectra of the layered system to investigate the variations of SP resonance and the associated resonance strength. The results show that for both p- and s-polarized incident lights, the plasmonic resonance can be manipulated by changing the thickness of the metamaterial. Otherwise, the plasmonic resonance strength for each SP mode can be tuned to become a maximum with proper slab thickness and light frequency for both polarized light. © 2006 IEEE.
AB - We will investigate the surface plasmon (SP) resonances of a dielectric-sandwiched metamaterial film. The parameters of the metamaterial are chose so that it has both negative s and μ in visible frequency range. We use transfer matrix method to calculate the attenuated total reflection (ATR) spectra of the layered system to investigate the variations of SP resonance and the associated resonance strength. The results show that for both p- and s-polarized incident lights, the plasmonic resonance can be manipulated by changing the thickness of the metamaterial. Otherwise, the plasmonic resonance strength for each SP mode can be tuned to become a maximum with proper slab thickness and light frequency for both polarized light. © 2006 IEEE.
UR - https://www.scopus.com/pages/publications/42649124612
UR - https://www.scopus.com/pages/publications/42649124612#tab=impact
U2 - 10.1109/NUSOD.2006.306737
DO - 10.1109/NUSOD.2006.306737
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 078039755
SN - 9780780397552
T3 - 2006 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, NUSOD '06
SP - 53
EP - 54
BT - 2006 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, NUSOD '06
T2 - 2006 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, NUSOD '06
Y2 - 11 September 2006 through 14 September 2006
ER -