Challenges Related to Reliability in Nano Electronics

Research output: Journal Publications and Reviews › Editorial Preface

31 Scopus Citations

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Author(s)

Way KUO

Detail(s)

Original language	English
Pages (from-to)	569-570
Journal / Publication	IEEE Transactions on Reliability
Volume	55
Issue number	4
Online published	30 Nov 2006
Publication status	Published - Dec 2006
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1109/TR.2006.884585 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-33947123335&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(5537f79e-3a2d-4eb2-89c4-496c647bcb23).html

Citation Format(s)

[ RIS ] [ BibTeX ]

Challenges Related to Reliability in Nano Electronics. / KUO, Way.
In: IEEE Transactions on Reliability, Vol. 55, No. 4, 12.2006, p. 569-570.

Research output: Journal Publications and Reviews › Editorial Preface

KUO, W 2006, 'Challenges Related to Reliability in Nano Electronics', IEEE Transactions on Reliability, vol. 55, no. 4, pp. 569-570. https://doi.org/10.1109/TR.2006.884585

KUO, W. (2006). Challenges Related to Reliability in Nano Electronics. IEEE Transactions on Reliability, 55(4), 569-570. https://doi.org/10.1109/TR.2006.884585

KUO W. Challenges Related to Reliability in Nano Electronics. IEEE Transactions on Reliability. 2006 Dec;55(4):569-570. Epub 2006 Nov 30. doi: 10.1109/TR.2006.884585

KUO, Way. / Challenges Related to Reliability in Nano Electronics. In: IEEE Transactions on Reliability. 2006 ; Vol. 55, No. 4. pp. 569-570.