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Cell-cell adhesion force measurement using nano picker via nanorobotic manipulators inside ESEM

Yajing Shen*, Mohd Ridzuan Ahmad, Masahiro Nakajima, Seiji Kojima, Michio Homma, Toshio Fukuda

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Cell-cell adhesion force is important for cell activities. In this paper, a novel cell-cell adhesion force measurement method using nano picker was proposed based on the nanorobotic manipulation system inside an environmental scanning electron microscopy (ESEM). The nano picker was fabricated from atomic force microscopy(AFM) cantilever by focused ion beam(FIB) etching. The spring constant of the nano picker was calibrated by nano manipulation approach. The cell which was selected for adhesion force measurement was first positioned on the top of another cell by a micro probe. Then, the nano picker was inserted to the join area between the two cells. Finally, the nano picker lifted the top cell by the actuating of nano manipulator inside environmental scanning electron microscopy ESEM. The cell-cell adhesion force can be measured based on the deflection of the cantilever during the cell separation. This method allowed the observation and manipulation of cell at nano scale simultaneously. Study of cell adhesion will benefit the understanding the mechanism of cell spreading, proliferation and so on. ©2010 IEEE.
Original languageEnglish
Title of host publication2010 10th IEEE Conference on Nanotechnology, NANO 2010
Pages870-874
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event10th IEEE International Conference on Nanotechnology (NANO 2010) - Ilsan, Gyeonggi-Do, Korea, Republic of
Duration: 17 Aug 201020 Aug 2010

Conference

Conference10th IEEE International Conference on Nanotechnology (NANO 2010)
PlaceKorea, Republic of
CityIlsan, Gyeonggi-Do
Period17/08/1020/08/10

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