Abstract
This paper reports on the cationic electron-beam curing of a high-functionality SU8 epoxy resin, which is extensively used as a UV-curing negative photoresist for micro-electronics machine systems (MEMS) applications. Results show that elevated post-curing treatment significantly increased both the conversion and the glass transition. The degree of conversion and the glass transition temperature were measured by using Fourier-transform infrared (FTIR) spectroscopy and modulated differential scanning calorimetry (MDSC®), respectively. The glass transition temperature (Tg), which has been observed to be dependent on the degree of conversion, reaches a maximum of 162°C at 50 Mrad and post-curing at 90°C. The degradation pattern of the cured resin does not show much variation for exposure at 5 Mrad, but does show significant variation for 50 Mrad exposure at various post-curing temperatures. A degree of conversion of more than 0.8 was achieved at a dosage of 30 Mrad with post curing at 80°C, for the epoxy resin with an average functionality of 8 a feature simply not achievable when using UV-curing. © 2004 Society of Chemical Industry.
| Original language | English |
|---|---|
| Pages (from-to) | 857-862 |
| Journal | Polymer International |
| Volume | 53 |
| Issue number | 7 |
| Online published | 10 May 2004 |
| DOIs | |
| Publication status | Published - Jul 2004 |
| Externally published | Yes |
Research Keywords
- Degree of conversion
- Electron-beam
- Glass transition temperature
- Modulated Differential Scanning Calorimetry (MDSC®)
- Post curing
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