Capillary Instabilities in Thin, Polycrystalline Films

David J. Srolovitz; S. A. Safran

doi:10.1557/proc-47-53

Capillary Instabilities in Thin, Polycrystalline Films

David J. Srolovitz
, S. A. Safran

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

4 Citations (Scopus)

Abstract

Thin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.

Original language	English
Title of host publication	Symposium C – Thin Films
Subtitle of host publication	The Relationship of Structure to Properties
Publisher	Cambridge University Press
Pages	53-60
Volume	47
DOIs	https://doi.org/10.1557/proc-47-53
Publication status	Published - Apr 1985
Externally published	Yes
Event	1985 MRS Spring Meeting - San Francisco, California, United States Duration: 15 Apr 1985 → 18 Apr 1985 https://www.mrs.org/spring1985

Publication series

Name	Materials Research Society Symposia Proceedings
Volume	47
ISSN (Electronic)	0272-9172

Conference

Conference	1985 MRS Spring Meeting
Place	United States
City	San Francisco, California
Period	15/04/85 → 18/04/85
Internet address	https://www.mrs.org/spring1985

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@inproceedings{88c425fd37134875b7233925a8b9d3fc,

title = "Capillary Instabilities in Thin, Polycrystalline Films",

abstract = "Thin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.",

author = "Srolovitz, \{David J.\} and Safran, \{S. A.\}",

year = "1985",

month = apr,

doi = "10.1557/proc-47-53",

language = "English",

volume = "47",

series = "Materials Research Society Symposia Proceedings",

publisher = "Cambridge University Press",

pages = "53--60",

booktitle = "Symposium C – Thin Films",

address = "United Kingdom",

note = "1985 MRS Spring Meeting ; Conference date: 15-04-1985 Through 18-04-1985",

url = "https://www.mrs.org/spring1985",

}

Srolovitz, DJ & Safran, SA 1985, Capillary Instabilities in Thin, Polycrystalline Films. in Symposium C – Thin Films: The Relationship of Structure to Properties. vol. 47, Materials Research Society Symposia Proceedings, vol. 47, Cambridge University Press, pp. 53-60, 1985 MRS Spring Meeting , San Francisco, California, United States, 15/04/85. https://doi.org/10.1557/proc-47-53

Capillary Instabilities in Thin, Polycrystalline Films. / Srolovitz, David J.; Safran, S. A.
Symposium C – Thin Films: The Relationship of Structure to Properties. Vol. 47 Cambridge University Press, 1985. p. 53-60 (Materials Research Society Symposia Proceedings; Vol. 47).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - Capillary Instabilities in Thin, Polycrystalline Films

AU - Srolovitz, David J.

AU - Safran, S. A.

PY - 1985/4

Y1 - 1985/4

N2 - Thin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.

AB - Thin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.

UR - https://www.scopus.com/pages/publications/0022176043

UR - https://www.scopus.com/pages/publications/0022176043#tab=impact

U2 - 10.1557/proc-47-53

DO - 10.1557/proc-47-53

M3 - RGC 32 - Refereed conference paper (with host publication)

VL - 47

T3 - Materials Research Society Symposia Proceedings

SP - 53

EP - 60

BT - Symposium C – Thin Films

PB - Cambridge University Press

T2 - 1985 MRS Spring Meeting

Y2 - 15 April 1985 through 18 April 1985

ER -

Capillary Instabilities in Thin, Polycrystalline Films

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