Capillary instabilities in thin films. II. Kinetics

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)255-260
Journal / PublicationJournal of Applied Physics
Volume60
Issue number1
Publication statusPublished - 1 Jul 1986
Externally publishedYes

Abstract

We consider the kinetic evolution of perturbations to thin films. Since all small (nonsubstrate intersecting) perturbations to the film surface decay, we consider the evolution of large perturbations, in the form of a single hole which exposes the substrate. For large holes, the hole radius increases at a constant rate under the assumption of evaporation/condensation kinetics. When the dominant transport mode is surface diffusion, large holes grow with a rate proportional to -3/4[log 3(/ ρ4)]. Small holes with a radii less than ρc shrink, where ρc is the film thickness divided by the tangent of the equilibrium wetting angle. The growth of these holes eventually leads to hole impingement which ruptures the film, creating a set of disconnected islands. The relaxation time for these islands to go to their equilibrium shape and size ( ρeq) scales as ρ2eq or ρ4eq for evaporation/condensation or surface diffusion kinetics, respectively.

Citation Format(s)

Capillary instabilities in thin films. II. Kinetics. / Srolovitz, D. J.; Safran, S. A.
In: Journal of Applied Physics, Vol. 60, No. 1, 01.07.1986, p. 255-260.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review