Calibration of lateral force of AFM measurement

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

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Detail(s)

Original languageEnglish
Title of host publicationProceedings of the 17th IEEE International Conference on Nanotechnology
PublisherIEEE
Pages121-124
ISBN (Electronic)978-1-5090-3028-6
Publication statusPublished - Jul 2017

Conference

Title17th IEEE International Conference on Nanotechnology (IEEE NANO 2017)
LocationPittsburgh Marriott City Center
PlaceUnited States
CityPittsburgh
Period25 - 28 July 2017

Abstract

Atomic force microscope (AFM) is a useful apparatus for measuring interaction forces between an AFM tip and samples at nanoscale. These forces can be classified into a normal force and a lateral force based on the deformation of AFM cantilever. The reliability of the measurement result is influenced by calibrating the spring constant of the AFM probe directly. However, it is still a challenge to quantitative lateral force because current calibration of lateral signal is complicated. Here, we present a simple experimental procedure to calculate a calibration factor of lateral force of a cantilever, and the method can be applied to most commercial AFM probes with rectangular cantilever.

Citation Format(s)

Calibration of lateral force of AFM measurement. / Gao, Qi; Wu, Guangfu; Lai, King Wai Chiu.

Proceedings of the 17th IEEE International Conference on Nanotechnology. IEEE, 2017. p. 121-124 8117333.

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)