TY - JOUR
T1 - Burn-in Optimization under Reliability & Capacity Restrictions
AU - Chi, Dong-Hae
AU - Kuo, Way
PY - 1989/6
Y1 - 1989/6
N2 - Burn-in is a method to screen out early failures of electronic components. The burn-in problems that minimize the system life-cycle cost have been investigated reasonably well in many applications, but physical constraints during the decision process have not been considered. This paper searches for optimal burn-in time and develops a cost-optimization model. Two types of constraints are to be satisfied during decison making: 1) The minimum system reliability requirement, and 2) The maximum capacity available for burn-in. Guidelines are suggested for making burn-in decisions. An example illustrates a practical application. The model generalizes the burn-in problems that were over-simplifed in a previous study. © 1989 IEEE
AB - Burn-in is a method to screen out early failures of electronic components. The burn-in problems that minimize the system life-cycle cost have been investigated reasonably well in many applications, but physical constraints during the decision process have not been considered. This paper searches for optimal burn-in time and develops a cost-optimization model. Two types of constraints are to be satisfied during decison making: 1) The minimum system reliability requirement, and 2) The maximum capacity available for burn-in. Guidelines are suggested for making burn-in decisions. An example illustrates a practical application. The model generalizes the burn-in problems that were over-simplifed in a previous study. © 1989 IEEE
KW - Burn-in
KW - Randomized pattern search
UR - http://www.scopus.com/inward/record.url?scp=0024686380&partnerID=8YFLogxK
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U2 - 10.1109/24.31104
DO - 10.1109/24.31104
M3 - RGC 21 - Publication in refereed journal
SN - 0018-9529
VL - 38
SP - 193
EP - 198
JO - IEEE Transactions on Reliability
JF - IEEE Transactions on Reliability
IS - 2
ER -