Skip to main navigation Skip to search Skip to main content

Buried channel waveguides using ion-exchange and field-assisted annealing in glass: Modeling and experiments

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Theoretical and experimental studies on buried ion-exchanged waveguides using field-assisted annealing (FAA) in erbium-doped phosphate glasses were reported. The procedure for making buried waveguides using a two-step process was demonstrated. An analytical model for the FAA process was developed, and both the refractive index profiles and the effective buried depths of these waveguides are predicted. This model is based upon the available data derived from the ion-exchanged planar waveguide measurements. The mode intensity profiles as well as the buried depths were measured with the use of standard end-fire coupling setup and a calibrated image capture card. The buried depths are found to be in good agreement with the simulated results.
Original languageEnglish
Title of host publicationActive and Passive Optical Components for WDM Communications IV
EditorsAchyut Kumar Dutta, Abdul Ahad Sami Awwal, Niloy K. Dutta, Yasutake Ohishi
PublisherSPIE
Pages404-412
DOIs
Publication statusPublished - Oct 2004
EventSPIE International Symposium - Optics East 2004 (Colocated with ITCom) - Philadelphia, PA, United States
Duration: 25 Oct 200428 Oct 2004

Publication series

NameProceedings of SPIE
Volume5595
ISSN (Print)0277-786X

Conference

ConferenceSPIE International Symposium - Optics East 2004 (Colocated with ITCom)
PlaceUnited States
CityPhiladelphia, PA
Period25/10/0428/10/04

Research Keywords

  • Buried glass waveguides
  • Field-assisted annealing
  • Integrated optics
  • Ion exchange

Fingerprint

Dive into the research topics of 'Buried channel waveguides using ion-exchange and field-assisted annealing in glass: Modeling and experiments'. Together they form a unique fingerprint.

Cite this