Blocking hillock and whisker growth by intermetallic compound formation in Sn-0.7Cu flip chip solder joints under electromigration

S. W. Liang, Chih Chen, J. K. Han, Luhua Xu, K. N. Tu, Yi-Shao Lai

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

18 Citations (Scopus)

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Engineering

Material Science