Bi-induced band gap reduction in epitaxial InSbBi alloys
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 212101 |
Journal / Publication | Applied Physics Letters |
Volume | 105 |
Issue number | 21 |
Publication status | Published - 24 Nov 2014 |
Externally published | Yes |
Link(s)
Abstract
The properties of molecular beam epitaxy-grown InSb1-xBix alloys are investigated. Rutherford backscattering spectrometry shows that the Bi content increases from 0.6% for growth at 350 °C to 2.4% at 200 °C. X-ray diffraction indicates Bi-induced lattice dilation and suggests a zinc-blende InBi lattice parameter of 6.626 Å. Scanning electron microscopy reveals surface InSbBi nanostructures on the InSbBi films for the lowest growth temperatures, Bi droplets at intermediate temperatures, and smooth surfaces for the highest temperature. The room temperature optical absorption edge was found to change from 172 meV (7.2 μm) for InSb to ∼88 meV (14.1 μm) for InSb0.976Bi0.024, a reduction of ∼35 meV/%Bi.
Citation Format(s)
Bi-induced band gap reduction in epitaxial InSbBi alloys. / Rajpalke, M. K.; Linhart, W. M.; Yu, K. M. et al.
In: Applied Physics Letters, Vol. 105, No. 21, 212101, 24.11.2014.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review