Bias-assisted etching of polycrystalline diamond films in hydrogen, oxygen, and argon microwave plasmas
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
---|---|
Pages (from-to) | 763-767 |
Journal / Publication | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 17 |
Issue number | 3 |
Publication status | Published - May 1999 |
Link(s)
Abstract
Bias-assisted etching of diamond films was performed in a microwave plasma chemical vapor deposition system. Hydrogen, hydrogen/oxygen, and hydrogen/argon mixtures were used as reactant gases. The effects of both the reactant gas compositions and applied substrate bias on the etching rate, surface morphology, and phase variation were investigated by scanning electron microscopy and Raman spectroscopy. The contribution of ions of different reactant gases to the etching of diamond films was discussed. © 1999 American Vacuum Society.
Citation Format(s)
Bias-assisted etching of polycrystalline diamond films in hydrogen, oxygen, and argon microwave plasmas. / Zhang, W. J.; Sun, C.; Bello, I. et al.
In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 17, No. 3, 05.1999, p. 763-767.
In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 17, No. 3, 05.1999, p. 763-767.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review