Abstract
The incorporation of Bi in GaSb1-xBix alloys grown by molecular beam epitaxy is investigated as a function of Bi flux at fixed growth temperature (275 °C) and growth rate (1 μm h-1). The Bi content is found to vary proportionally with Bi flux with Bi contents, as measured by Rutherford backscattering, in the range 0
Original language | English |
---|---|
Pages (from-to) | 241-244 |
Journal | Journal of Crystal Growth |
Volume | 425 |
Online published | 5 Mar 2015 |
DOIs | |
Publication status | Published - 1 Sept 2015 |
Research Keywords
- A1. High resolution X-ray diffraction
- A3. Molecular beam epitaxy
- B1. Antimonides
- B1. Bismuth compounds
- B1. Gallium compounds
- B2. Semiconducting III-V materials
Publisher's Copyright Statement
- This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/