Bi flux-dependent MBE growth of GaSbBi alloys

M. K. Rajpalke, W. M. Linhart, K. M. Yu, T. S. Jones, M. J. Ashwin, T. D. Veal*

*Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    30 Citations (Scopus)
    60 Downloads (CityUHK Scholars)

    Abstract

    The incorporation of Bi in GaSb1-xBix alloys grown by molecular beam epitaxy is investigated as a function of Bi flux at fixed growth temperature (275 °C) and growth rate (1 μm h-1). The Bi content is found to vary proportionally with Bi flux with Bi contents, as measured by Rutherford backscattering, in the range 0
    Original languageEnglish
    Pages (from-to)241-244
    JournalJournal of Crystal Growth
    Volume425
    Online published5 Mar 2015
    DOIs
    Publication statusPublished - 1 Sept 2015

    Research Keywords

    • A1. High resolution X-ray diffraction
    • A3. Molecular beam epitaxy
    • B1. Antimonides
    • B1. Bismuth compounds
    • B1. Gallium compounds
    • B2. Semiconducting III-V materials

    Publisher's Copyright Statement

    • This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/

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