Abstract
A low energy beam of spin polarized 8Li+ has been employed to study the magnetic field distribution in an epitaxial thin film of 5.4% Mn doped GaAs(180 nm) on a (1 0 0) GaAs substrate via beta-detected NMR. The spectrum is a strong function of the implantation energy in the range 28-3 keV. In the magnetic layer, there is no indication of a missing fraction, and even more remarkable, there is a broad negatively shifted resonance. The spin lattice relaxation rate is, however, much faster in the Mn doped layer than in the substrate. A sharp peak characteristic of nonmagnetic GaAs is observed down to the lowest implantation energy, for which none of the Li should reach the substrate. This unexpected depth dependence is discussed. © 2008 Elsevier B.V. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 892-895 |
| Journal | Physica B: Condensed Matter |
| Volume | 404 |
| Issue number | 5-7 |
| DOIs | |
| Publication status | Published - 15 Apr 2009 |
| Externally published | Yes |
Research Keywords
- Dilute ferromagnetic semiconductor
- GaAs:Mn
- Low energy muon
- Magnetism
- Thin films
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