TY - JOUR
T1 - Bayesian Networks in Fault Diagnosis
AU - Cai, Baoping
AU - Huang, Lei
AU - Xie, Min
PY - 2017/10
Y1 - 2017/10
N2 - Fault diagnosis is useful in helping technicians detect, isolate, and identify faults, and troubleshoot. Bayesian network (BN) is a probabilistic graphical model that effectively deals with various uncertainty problems. This model is increasingly utilized in fault diagnosis. This paper presents bibliographical review on use of BNs in fault diagnosis in the last decades with focus on engineering systems. This work also presents general procedure of fault diagnosis modeling with BNs; processes include BN structure modeling, BN parameter modeling, BN inference, fault identification, validation, and verification. The paper provides series of classification schemes for BNs for fault diagnosis, BNs combined with other techniques, and domain of fault diagnosis with BN. This study finally explores current gaps and challenges and several directions for future research.
AB - Fault diagnosis is useful in helping technicians detect, isolate, and identify faults, and troubleshoot. Bayesian network (BN) is a probabilistic graphical model that effectively deals with various uncertainty problems. This model is increasingly utilized in fault diagnosis. This paper presents bibliographical review on use of BNs in fault diagnosis in the last decades with focus on engineering systems. This work also presents general procedure of fault diagnosis modeling with BNs; processes include BN structure modeling, BN parameter modeling, BN inference, fault identification, validation, and verification. The paper provides series of classification schemes for BNs for fault diagnosis, BNs combined with other techniques, and domain of fault diagnosis with BN. This study finally explores current gaps and challenges and several directions for future research.
KW - Bayesian networks (BNs)
KW - fault diagnosis
UR - http://www.scopus.com/inward/record.url?scp=85031108435&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85031108435&origin=recordpage
U2 - 10.1109/TII.2017.2695583
DO - 10.1109/TII.2017.2695583
M3 - RGC 21 - Publication in refereed journal
SN - 1551-3203
VL - 13
SP - 2227
EP - 2240
JO - IEEE Transactions on Industrial Informatics
JF - IEEE Transactions on Industrial Informatics
IS - 5
M1 - 7904628
ER -