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Bayesian MRF modeling and graph cuts for phase unwrapping with discontinuity phase flaws: A comparative study

  • Fan Guang Zeng
  • , Guang Min Wu
  • , John D. Mai
  • , Jian Ming Chen

    Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

    Abstract

    Phase unwrapping (PU) is a difficult task commonly found in applications involving interferometric synthetic aperture radar (InSAR), magnetic resonance imaging (MRI) and optical surface profile measurements; all of which involve mathematically ill-posed problems. Conventional algorithms exhibit strong shortcomings in PU when phase discontinuity flaws exist. To simulate these situations, we are custom-designed test data with a phase discontinuity flaw. This simulated data is a 3D Gaussian distribution with an arc-shaped notch as a phase flaw. PU is carried out by Bayesian inference and MRF (Markov Random Field) modeling. A graph cut algorithm is employed for optimization with respect to energy minimization. Three other conventional algorithms are also employed and their PU performance is compared. The results show the good performance and effectiveness of the Bayesian MRF modeling method. These experimental results are important references for phase unwrapping problems when phase discontinuities exist. © (2014) Trans Tech Publications, Switzerland.
    Original languageEnglish
    Title of host publicationFrontiers of Manufacturing and Design Science IV
    PublisherTrans Tech Publications Ltd.
    Pages1915-1918
    Volume496-500
    ISBN (Print)9783037859926
    DOIs
    Publication statusPublished - 2014
    Event4th International Conference on Frontiers of Manufacturing and Design Science, ICFMD 2013 - Hong Kong, China
    Duration: 10 Sept 201312 Sept 2013

    Publication series

    NameApplied Mechanics and Materials
    Volume496-500
    ISSN (Print)1660-9336
    ISSN (Electronic)1662-7482

    Conference

    Conference4th International Conference on Frontiers of Manufacturing and Design Science, ICFMD 2013
    PlaceChina
    CityHong Kong
    Period10/09/1312/09/13

    Bibliographical note

    Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

    Research Keywords

    • Branch-cut
    • Graph-cuts
    • Least squares
    • MRF
    • Optimization
    • Phase unwrapping
    • Quality guided

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