Bayesian modeling approach for predicting residual life of two-phase degradation

Suk Joo Bae, Tao Yuan, Shuluo Ling, Way Kuo

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Original language	English
Title of host publication	62nd IIE Annual Conference and Expo 2012
Publisher	Institute of Industrial Engineers
Publication status	Published - 2012
Event	62nd IIE Annual Conference and Expo 2012 - Orlando, FL, United States Duration: 19 May 2012 → 23 May 2012

Conference	62nd IIE Annual Conference and Expo 2012
Place	United States
City	Orlando, FL
Period	19/05/12 → 23/05/12

Other Access Options

@inproceedings{e7f9b6469da34a779e0cb8cebc554977,

title = "Bayesian modeling approach for predicting residual life of two-phase degradation",

author = "Bae, {Suk Joo} and Tao Yuan and Shuluo Ling and Way Kuo",

year = "2012",

language = "English",

booktitle = "62nd IIE Annual Conference and Expo 2012",

publisher = "Institute of Industrial Engineers",

note = "62nd IIE Annual Conference and Expo 2012 ; Conference date: 19-05-2012 Through 23-05-2012",

}

TY - GEN

T1 - Bayesian modeling approach for predicting residual life of two-phase degradation

AU - Bae, Suk Joo

AU - Yuan, Tao

AU - Ling, Shuluo

AU - Kuo, Way

PY - 2012

Y1 - 2012

UR - http://www.scopus.com/inward/record.url?scp=84900305564&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84900305564&origin=recordpage

M3 - RGC 32 - Refereed conference paper (with host publication)

BT - 62nd IIE Annual Conference and Expo 2012

PB - Institute of Industrial Engineers

T2 - 62nd IIE Annual Conference and Expo 2012

Y2 - 19 May 2012 through 23 May 2012

ER -