Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 117-120 |
| Journal / Publication | Journal of Testing and Evaluation |
| Volume | 22 |
| Issue number | 2 |
| Online published | 1 Mar 1994 |
| Publication status | Published - Mar 1994 |
| Externally published | Yes |
Link(s)
Abstract
Back-face strain compliance and electrical-potential crack length calibrations have been experimentally determined for the disk-shaped compact-tension DC(T) specimen. Finite-element modeling was used to ascertain the back-face strain distribution at several crack lengths to determine the significance of inconsistent gage placement. The numerical solutions demonstrated good agreement with experiment, especially at smaller crack lengths when the back-face strain gradients are minimal. It is concluded that precise gage placement is only critical when the crack tip closely approaches the back of the test specimen.
Citation Format(s)
Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen. / Gilbert, CJ; McNaney, JM; Dauskardt, RH et al.
In: Journal of Testing and Evaluation, Vol. 22, No. 2, 03.1994, p. 117-120.
In: Journal of Testing and Evaluation, Vol. 22, No. 2, 03.1994, p. 117-120.
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
