Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen

CJ Gilbert, JM McNaney, RH Dauskardt, RO Ritchie

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

28 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen'. Together they form a unique fingerprint.

Engineering