Automated inspection process planning : Algorithmic inspection feature recognition, and inspection case representation for CBR
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 56-68 |
Journal / Publication | Robotics and Computer-Integrated Manufacturing |
Volume | 22 |
Issue number | 1 |
Publication status | Published - Feb 2006 |
Link(s)
Abstract
General metrological inspection planning is among the least explored computer-aided process planning (CAPP) domains. This paper explores certain basic issues involved in inspection planning using case-based reasoning in an environment of a Generic CAPP Support System. Firstly, algorithmic methods for characterizing and extracting inspection features are proposed and discussed. A sequential knowledge based filtering method is developed to reduce the number of inspection features typically encountered in metrological inspection planning. Finally, a formalized approach for case representation of relevant inspection domain knowledge using a newly developed parametric-list technological feature graph (PLTFG) is presented. © 2005 Elsevier Ltd. All rights reserved.
Research Area(s)
- Case-based reasoning, Computer-aided inspection process planning, Computer-aided process planning, Inspection feature recognition
Citation Format(s)
Automated inspection process planning : Algorithmic inspection feature recognition, and inspection case representation for CBR. / Wong, F. S Y; Chuah, K. B.; Venuvinod, P. K.
In: Robotics and Computer-Integrated Manufacturing, Vol. 22, No. 1, 02.2006, p. 56-68.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review