Atomic-Scale Observation of Unusual Dislocations in GaAs-GaAsSb Heterostructured Nanowires

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • Xianlin Qu
  • Chen Zhou
  • Ang Li
  • Wei Li
  • Kaiwen Wang
  • Kun Zheng

Detail(s)

Original languageEnglish
Pages (from-to)7513–7521
Journal / PublicationACS Applied Materials and Interfaces
Volume14
Issue number5
Online published25 Jan 2022
Publication statusPublished - 9 Feb 2022

Abstract

Cognizing the structural characteristics of a heterointerface is significant to understand the growth mechanism of heterostructured nanowires. Here, the structural characteristics of a heterointerface in GaAs-GaAsSb heterostructured nanowires were investigated by employing spherical aberration (CS)-corrected transmission electron microscopy (TEM). It is found that some unusual dislocations are formed at the heterointerface, leading to the bending of nanowires. Further, the atomically inhomogeneous distribution of Sb content near the heterointerface is revealed, which is responsible for the formation of dislocations. By applying a thermal electric system equipped in the Cs-corrected TEM, a direct observation of structural evolution at the heterointerface was enabled and the stability of GaAs-GaAsSb heterostructured nanowires was evaluated. In situ high-resolution TEM imaging indicates that the destabilization of the heterointerface occurs during nanowire annealing. This study builds a direct correlation between the nanowire heterointerfacial structure with nanowire growth behavior and its stability, which is of importance for heterostructured nanowire design for practical use.

Research Area(s)

  • Cs-corrected TEM, heterointerface, heterostructure nanowires, III-Sb semiconductors, in situ TEM

Citation Format(s)

Atomic-Scale Observation of Unusual Dislocations in GaAs-GaAsSb Heterostructured Nanowires. / Qu, Xianlin; Zhou, Chen; Li, Ang et al.
In: ACS Applied Materials and Interfaces, Vol. 14, No. 5, 09.02.2022, p. 7513–7521.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review