Abstract
Results of high-energy X-ray diffraction experiments coupled to atomic pair distribution function analysis of disordered low-Z materials are presented. Several scientifically and technologically important classes of disordered low-Z materials such as small and large organic molecules, graphitic powders, polymers and liquids are intentionally explored to certify the technique's performance. Results clearly show that disordered low-Z materials can be well characterized in terms of material's phase identity, relative abundance in mixtures and atomic-scale structure. The demonstrated efficiency of the technique provides the scientific community with much needed confidence to apply it more often than now. © 2013 The Owner Societies.
| Original language | English |
|---|---|
| Pages (from-to) | 8544-8554 |
| Journal | Physical Chemistry Chemical Physics |
| Volume | 15 |
| Issue number | 22 |
| DOIs | |
| Publication status | Published - 14 Jun 2013 |
| Externally published | Yes |
Bibliographical note
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