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Atomic pair distribution functions analysis of disordered low-Z materials

  • V. Petkov
  • , Y. Ren
  • , S. Kabekkodu
  • , D. Murphy

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Results of high-energy X-ray diffraction experiments coupled to atomic pair distribution function analysis of disordered low-Z materials are presented. Several scientifically and technologically important classes of disordered low-Z materials such as small and large organic molecules, graphitic powders, polymers and liquids are intentionally explored to certify the technique's performance. Results clearly show that disordered low-Z materials can be well characterized in terms of material's phase identity, relative abundance in mixtures and atomic-scale structure. The demonstrated efficiency of the technique provides the scientific community with much needed confidence to apply it more often than now. © 2013 The Owner Societies.
Original languageEnglish
Pages (from-to)8544-8554
JournalPhysical Chemistry Chemical Physics
Volume15
Issue number22
DOIs
Publication statusPublished - 14 Jun 2013
Externally publishedYes

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