Around-the-Corner or Through-the-Wall? Classification of Non-Line-of-Sight Conditions

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

1 Scopus Citations
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Detail(s)

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE 18th International Conference on Industrial Informatics (INDIN)
PublisherIEEE
Pages142-145
ISBN (Electronic)9781728149646
ISBN (Print)9781728149653, 9781728149639
Publication statusPublished - Jul 2020

Publication series

NameIEEE International Conference on Industrial Informatics (INDIN)
Volume2020-July
ISSN (Print)1935-4576

Conference

Title18th IEEE International Conference on Industrial Informatics (INDIN 2020)
LocationOnline
PlaceUnited Kingdom
CityWarwick
Period21 - 23 July 2020

Abstract

It is well known that location accuracy is low in non-line-of-sight (NLOS) scenarios. Several techniques have been proposed to mitigate ranging errors to improve location accuracy. These techniques play an important role in accurate localization for many applications which target safety and productivity in harsh industrial environments. In some cases, these mitigation techniques target specific NLOS scenarios, therefore such scenarios have to identified before mitigation can be applied. In this paper, we study identification of two types of NLOS scenarios that are common indoors: Through-The-Wall (TTW) and Around-The-Corner (ATC). We conduct a measurement campaign in various indoor TTW and ATC scenarios, and show that these two types of NLOS scenarios can be differentiated with high accuracy using channel statistics from ultra-wideband radios.

Research Area(s)

  • localization, non-line-of-sight, wireless sensor networks

Citation Format(s)

Around-the-Corner or Through-the-Wall? Classification of Non-Line-of-Sight Conditions. / Silva, Bruno J.; Hancke, Gerhard P.
Proceedings - 2020 IEEE 18th International Conference on Industrial Informatics (INDIN). IEEE, 2020. p. 142-145 9442247 (IEEE International Conference on Industrial Informatics (INDIN); Vol. 2020-July).

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review