TY - JOUR
T1 - Approaches for reliability modeling of continuous-strfi devices
AU - Zuo, Ming J.
AU - Yam, Richard C.M.
AU - Jiang, Kenyan
PY - 1999
Y1 - 1999
N2 - Three approaches for reliability modelling of continuous state devices are presented in this paper. One uses the random process to fit model parameters of a statistical distribution as functions of time. This approach allows the data set to be from any general distribution. The second approach uses the general path model to fit parameters of the model as functions of time. The relationship between the random process model and the general path model is illustrated. The third approach uses multiple linear regression to fit the distribution of lifetime directly. This approach has less restriction on the degradation data to be analyzed. All three approaches are illustrated with examples. Finally a mixture model is proposed which can be used to model both catastrophic failures and degradation failures. This mixture model also shows engineers how to design experiments to collect both hard failure data and soft failure data. Topics for further investigation in continuous device reliability modelling include further investigation of the mixture model, application of these models to practical situations, and using complex statistical distributions to fit degradation data. ©1999 IEEE.
AB - Three approaches for reliability modelling of continuous state devices are presented in this paper. One uses the random process to fit model parameters of a statistical distribution as functions of time. This approach allows the data set to be from any general distribution. The second approach uses the general path model to fit parameters of the model as functions of time. The relationship between the random process model and the general path model is illustrated. The third approach uses multiple linear regression to fit the distribution of lifetime directly. This approach has less restriction on the degradation data to be analyzed. All three approaches are illustrated with examples. Finally a mixture model is proposed which can be used to model both catastrophic failures and degradation failures. This mixture model also shows engineers how to design experiments to collect both hard failure data and soft failure data. Topics for further investigation in continuous device reliability modelling include further investigation of the mixture model, application of these models to practical situations, and using complex statistical distributions to fit degradation data. ©1999 IEEE.
KW - And mixture model
KW - Catastrophic failure
KW - Continuous state
KW - Degradation failure
KW - Performance degradation
KW - Regression model
KW - Weibull distribution
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UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0032676359&origin=recordpage
U2 - 10.1109/24.765922
DO - 10.1109/24.765922
M3 - 21_Publication in refereed journal
VL - 48
SP - 9
EP - 18
JO - IEEE Transactions on Reliability
JF - IEEE Transactions on Reliability
SN - 0018-9529
IS - 1
ER -