Applications of transmission electron microscopy to microstructural studies of epitaxial thin films
|Journal / Publication||Surface and Coatings Technology|
|Publication status||Published - Apr 1989|
|Link to Scopus||https://www.scopus.com/record/display.uri?eid=2-s2.0-0024640069&origin=recordpage|
In this paper the applications of transmission electron microscopy to microstructural studies of epitaxial thin films are reviewed. Transmission electron microscopy is a powerful technique for determining the crystallographic structures and orientation relationships between thin films and substrates. The epitaxial thin films discussed in this paper can be grown by electrochemical techniques, oxidation or electron beam evaporation. The epitaxial structures formed on various substrates by the above techniques are discussed. © 1989.
Surface and Coatings Technology, Vol. 37, No. 2, 04.1989, p. 203-216.
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review