TY - JOUR
T1 - Applications of transmission electron microscopy to microstructural studies of epitaxial thin films
AU - Tjong, S. C.
PY - 1989/4
Y1 - 1989/4
N2 - In this paper the applications of transmission electron microscopy to microstructural studies of epitaxial thin films are reviewed. Transmission electron microscopy is a powerful technique for determining the crystallographic structures and orientation relationships between thin films and substrates. The epitaxial thin films discussed in this paper can be grown by electrochemical techniques, oxidation or electron beam evaporation. The epitaxial structures formed on various substrates by the above techniques are discussed. © 1989.
AB - In this paper the applications of transmission electron microscopy to microstructural studies of epitaxial thin films are reviewed. Transmission electron microscopy is a powerful technique for determining the crystallographic structures and orientation relationships between thin films and substrates. The epitaxial thin films discussed in this paper can be grown by electrochemical techniques, oxidation or electron beam evaporation. The epitaxial structures formed on various substrates by the above techniques are discussed. © 1989.
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U2 - 10.1016/0257-8972(89)90103-5
DO - 10.1016/0257-8972(89)90103-5
M3 - RGC 21 - Publication in refereed journal
SN - 0257-8972
VL - 37
SP - 203
EP - 216
JO - Surface and Coatings Technology
JF - Surface and Coatings Technology
IS - 2
ER -