Application of the complex image method to characterization of microstrip vias

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Original languageEnglish
Pages (from-to)368-379
Journal / PublicationInternational Journal of RF and Microwave Computer-Aided Engineering
Issue number5
Publication statusPublished - 1997


This article demonstrates the use of the complex image method for the characterization of a microstrip via connecting two microstrip lines located on different levels of a multilayered structure. The Green's function for the vertical component of the vector potential due to a horizontal source has a cos Φ dependence, which requires a different identity for the complex images. A hybrid basis function is employed at the junctions of the horizontal microstrip line and the vertical via. A technique for recovering impedance matrix symmetry is discussed when RWG discretization is employed. © 1997 John Wiley & Sons, Inc.

Research Area(s)

  • Complex image method, Method of moments, Microstrip vias, Multilayered media