Apparent Colors of 2D Materials

Sergio Puebla; Hai Li; Hua Zhang; Andres Castellanos-Gomez

doi:10.1002/adpr.202100221

Apparent Colors of 2D Materials

Sergio Puebla^*, Hai Li, Hua Zhang, Andres Castellanos-Gomez

^*Corresponding author for this work

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Abstract

Finding 2D and thin-film layered materials have become essential to develop not only in scientific-related fields, but also in a wide industry, which is constantly feeding from this progress. For electronic devices, thin-film materials are supposed to be a step forward to overcome Moore's law. In many other technologic areas, the development of tools based on flakes of materials has found new physics, becoming a rising field. Although, destructive techniques are commonly used to characterize the thickness of these materials. Herein, a list of materials is presented, whose thicknesses are characterized by their apparent colors in several substrates, a harmless, fast, and reliable technique that has been already used to determine the number of layers in several works. This list is also enlarged with other materials and substrates.

Original language	English
Article number	2100221
Journal	Advanced Photonics Research
Volume	3
Issue number	4
Online published	5 Jan 2022
DOIs	https://doi.org/10.1002/adpr.202100221
Publication status	Published - Apr 2022

Funding

This project received funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation programme (grant agreement no 755655, ERC-StG 2017 project 2D-TOPSENSE) and the Spanish Ministry of Economy, Industry and Competitiveness through the grant MAT2017-87134-C2-2-R. S.P. acknowledges the fellowship PRE2018-084818. H.Z. thanks the support from ITC via the Hong Kong Branch of National Precious Metals Material Engineering Research Center (NPMM), the Research Grants Council of Hong Kong (AoE/P-701/20), the Start-Up Grant (project no.9380100) and the grants (project nos. 9610478, 9680314, 7020013, and 1886921) from the City University of Hong Kong and the Science Technology and Innovation Committee of Shenzhen Municipality (grant no. JCYJ20200109143412311).

Research Keywords

2D materials
apparent colors
flakes
optical contrasts
SiO2
thin films
FIELD-EFFECT TRANSISTORS
TRANSITION-METAL DICHALCOGENIDES
DER-WAALS HETEROSTRUCTURES
HEXAGONAL BORON-NITRIDE
CHARGE-DENSITY WAVES
OPTICAL-PROPERTIES
HIGH-PERFORMANCE
HIGH-MOBILITY
BAND-GAP
SINGLE-CRYSTALS

Publisher's Copyright Statement

This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/

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title = "Apparent Colors of 2D Materials",

abstract = "Finding 2D and thin-film layered materials have become essential to develop not only in scientific-related fields, but also in a wide industry, which is constantly feeding from this progress. For electronic devices, thin-film materials are supposed to be a step forward to overcome Moore's law. In many other technologic areas, the development of tools based on flakes of materials has found new physics, becoming a rising field. Although, destructive techniques are commonly used to characterize the thickness of these materials. Herein, a list of materials is presented, whose thicknesses are characterized by their apparent colors in several substrates, a harmless, fast, and reliable technique that has been already used to determine the number of layers in several works. This list is also enlarged with other materials and substrates.",

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AU - Li, Hai

AU - Zhang, Hua

AU - Castellanos-Gomez, Andres

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N2 - Finding 2D and thin-film layered materials have become essential to develop not only in scientific-related fields, but also in a wide industry, which is constantly feeding from this progress. For electronic devices, thin-film materials are supposed to be a step forward to overcome Moore's law. In many other technologic areas, the development of tools based on flakes of materials has found new physics, becoming a rising field. Although, destructive techniques are commonly used to characterize the thickness of these materials. Herein, a list of materials is presented, whose thicknesses are characterized by their apparent colors in several substrates, a harmless, fast, and reliable technique that has been already used to determine the number of layers in several works. This list is also enlarged with other materials and substrates.

AB - Finding 2D and thin-film layered materials have become essential to develop not only in scientific-related fields, but also in a wide industry, which is constantly feeding from this progress. For electronic devices, thin-film materials are supposed to be a step forward to overcome Moore's law. In many other technologic areas, the development of tools based on flakes of materials has found new physics, becoming a rising field. Although, destructive techniques are commonly used to characterize the thickness of these materials. Herein, a list of materials is presented, whose thicknesses are characterized by their apparent colors in several substrates, a harmless, fast, and reliable technique that has been already used to determine the number of layers in several works. This list is also enlarged with other materials and substrates.

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KW - CHARGE-DENSITY WAVES

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DO - 10.1002/adpr.202100221

M3 - RGC 21 - Publication in refereed journal

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VL - 3

JO - Advanced Photonics Research

JF - Advanced Photonics Research

IS - 4

M1 - 2100221

ER -

Apparent Colors of 2D Materials

Abstract

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Research Keywords

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AoE(UGC)-ExtU-Lead: 2D Materials Research: Fundamentals Towards Emerging Technologies

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Apparent Colors of 2D Materials

Abstract

Funding

Research Keywords

Publisher's Copyright Statement

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Projects

AoE(UGC)-ExtU-Lead: 2D Materials Research: Fundamentals Towards Emerging Technologies

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