Antiwear Leveling Design for SSDs With Hybrid ECC Capability
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 7527690 |
Pages (from-to) | 488-501 |
Journal / Publication | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 25 |
Issue number | 2 |
Online published | 1 Aug 2016 |
Publication status | Published - Feb 2017 |
Externally published | Yes |
Link(s)
Abstract
With the joint considerations of reliability and performance, hybrid error correction code (ECC) becomes an option in the designs of solid-state drives (SSDs). Unfortunately, wear leveling (WL) might result in the early performance degradation to SSDs, which is common with a limited number of P/E cycles, due to the efforts to delay the bit-error-rate growth. In this paper, an anti-WL design is proposed to avoid such a performance problem so that the performance of SSDs with hybrid ECC capability can be improved without sacrificing their reliability. The capability of the proposed design was evaluated by a series of experiments, for which it was shown that the proposed design could greatly improve the read and write performance of SSDs up to 50% without affecting the endurance of the investigated SSDs, compared with traditional approaches.
Research Area(s)
- Antiwear leveling, Bose-Chaudhuri-Hocquenghem (BCH), Flash memory, Flash storage device, hybrid error correction code (ECC), low-density parity check (LDPC), solid-state drive (SSD), Storage systems
Citation Format(s)
Antiwear Leveling Design for SSDs With Hybrid ECC Capability. / Ho, Chien-Chung; Liu, Yu-Ping; Chang, Yuan-Hao et al.
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 25, No. 2, 7527690, 02.2017, p. 488-501.
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 25, No. 2, 7527690, 02.2017, p. 488-501.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review