Abstract
The authors demonstrate organic ferroelectric field effect transistors using poly(vinylidene fluoride-trifluoroethylene) as dielectric in bottom common gate and patterned gate devices. Drain current hysteresis is resulted from the dipole switching at channel region due to gate-source bias. For common gate device, an additional anomalous polarization switching is observed due to gate-drain bias. This switching has no effect on the hysteresis direction yet incurs a strong peak in the off drain current leading to unstable and uncontrollable off state in memory device. Reduction of gate-drain overlapping using patterned metal gate shows diminishing the anomalous switching hence improves performance of the ferroelectric transistors. © 2007 American Institute of Physics.
| Original language | English |
|---|---|
| Article number | 042909 |
| Journal | Applied Physics Letters |
| Volume | 91 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 23 Jul 2007 |
| Externally published | Yes |
Funding
One of the authors (C.A.N.) would like to acknowledge the research scholarship awarded by Nanyang Technological University. This work is supported by A* Star under Grant No. 0521170032 and NTU Acrf Grant No. RG26/05.