Anomalous polarization switching in organic ferroelectric field effect transistors

C. A. Nguyen*, P. S. Lee*, N. Ng, H. Su, S. G. Mhaisalkar, J. Ma, F. Y. C. Boey

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

17 Citations (Scopus)

Abstract

The authors demonstrate organic ferroelectric field effect transistors using poly(vinylidene fluoride-trifluoroethylene) as dielectric in bottom common gate and patterned gate devices. Drain current hysteresis is resulted from the dipole switching at channel region due to gate-source bias. For common gate device, an additional anomalous polarization switching is observed due to gate-drain bias. This switching has no effect on the hysteresis direction yet incurs a strong peak in the off drain current leading to unstable and uncontrollable off state in memory device. Reduction of gate-drain overlapping using patterned metal gate shows diminishing the anomalous switching hence improves performance of the ferroelectric transistors. © 2007 American Institute of Physics.
Original languageEnglish
Article number042909
JournalApplied Physics Letters
Volume91
Issue number4
DOIs
Publication statusPublished - 23 Jul 2007
Externally publishedYes

Funding

One of the authors (C.A.N.) would like to acknowledge the research scholarship awarded by Nanyang Technological University. This work is supported by A* Star under Grant No. 0521170032 and NTU Acrf Grant No. RG26/05.

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