Anisotropy of the elastic properties of wurtzite InN epitaxial films
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 79-89 |
| Journal / Publication | Defect and Diffusion Forum |
| Volume | 226-228 |
| Issue number | 1 |
| Publication status | Published - 2004 |
| Externally published | Yes |
Link(s)
Abstract
The anisotropy of elastic bulk constants of wurtzite InN is analyzed theoretically on the basis of available data for elastic constants. A considerable anisotropy is evaluated both for Young's modulus and Poisson ratio of highly textured InN epitaxial films deposited on the basal plane. A comparative analysis of elastic properties is conducted for wurtzite InN, GaN and AlN. An approach is suggested for estimating vacancy concentrations on the basis of SIMS and x-ray diffraction measurements.
Research Area(s)
- Elastic Anisotropy, Point Defects, Strain, Wurtzite Nitrides, X-Ray Diffraction
Citation Format(s)
Anisotropy of the elastic properties of wurtzite InN epitaxial films. / Harutyunyan, V. S.; Specht, P.; Ho, J. et al.
In: Defect and Diffusion Forum, Vol. 226-228, No. 1, 2004, p. 79-89.
In: Defect and Diffusion Forum, Vol. 226-228, No. 1, 2004, p. 79-89.
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
