Analysis of thin-strip scatterer by MEI

Y. L. Luo; K. M. Luk; K. K. Mei; E. K. N. Yung

doi:10.1109/APMC.1997.659426

Analysis of thin-strip scatterer by MEI

Y. L. Luo, K. M. Luk, K. K. Mei, E. K. N. Yung

Department of Electrical Engineering

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Abstract

MEI has been applied to solve many kinds of electromagnetic radiation and scattering problems. In this paper concern MEI solution and singularity when it is used to analyze scattering problem of metallic thin-strip scatterers. In our analysis, a conformal mesh is employed. A 6-point MEI is used to find the truncation boundary condition. The singularity of MEI exists in the vicinity of ends of a two-dimensional thin-strip scatterers. For mesh nodes in vicinity of ends of the thin-strip scatterer, values of measuring function are very close for different metrons used. This will result in the ill-conditioned of MEI and MEI coefficients. In this paper, we will show this phenomena and our measurement for dealing with such problem. Numerical results are obtained to compare with those by Method of Moments.

Original language	English
Title of host publication	Proceedings of 1997 Asia-Pacific Microwave Conference
Publisher	IEEE
Pages	473-476
Volume	1
ISBN (Print)	962-442-117-X
DOIs	https://doi.org/10.1109/APMC.1997.659426
Publication status	Published - Dec 1997
Event	1997 Asia-Pacific Microwave Conference (APMC 97) - Hong Kong, China Duration: 2 Dec 1997 → 5 Dec 1997

Conference

Conference	1997 Asia-Pacific Microwave Conference (APMC 97)
Place	China
City	Hong Kong
Period	2/12/97 → 5/12/97

Access Output

10.1109/APMC.1997.659426

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@inproceedings{35fb97c83f9340d9811c16fdd520c899,

title = "Analysis of thin-strip scatterer by MEI",

abstract = "MEI has been applied to solve many kinds of electromagnetic radiation and scattering problems. In this paper concern MEI solution and singularity when it is used to analyze scattering problem of metallic thin-strip scatterers. In our analysis, a conformal mesh is employed. A 6-point MEI is used to find the truncation boundary condition. The singularity of MEI exists in the vicinity of ends of a two-dimensional thin-strip scatterers. For mesh nodes in vicinity of ends of the thin-strip scatterer, values of measuring function are very close for different metrons used. This will result in the ill-conditioned of MEI and MEI coefficients. In this paper, we will show this phenomena and our measurement for dealing with such problem. Numerical results are obtained to compare with those by Method of Moments.",

author = "Luo, {Y. L.} and Luk, {K. M.} and Mei, {K. K.} and Yung, {E. K. N.}",

year = "1997",

month = dec,

doi = "10.1109/APMC.1997.659426",

language = "English",

isbn = "962-442-117-X",

volume = "1",

pages = "473--476",

booktitle = "Proceedings of 1997 Asia-Pacific Microwave Conference",

publisher = "IEEE",

address = "United States",

note = "1997 Asia-Pacific Microwave Conference (APMC 97) ; Conference date: 02-12-1997 Through 05-12-1997",

}

TY - GEN

T1 - Analysis of thin-strip scatterer by MEI

AU - Luo, Y. L.

AU - Luk, K. M.

AU - Mei, K. K.

AU - Yung, E. K. N.

PY - 1997/12

Y1 - 1997/12

N2 - MEI has been applied to solve many kinds of electromagnetic radiation and scattering problems. In this paper concern MEI solution and singularity when it is used to analyze scattering problem of metallic thin-strip scatterers. In our analysis, a conformal mesh is employed. A 6-point MEI is used to find the truncation boundary condition. The singularity of MEI exists in the vicinity of ends of a two-dimensional thin-strip scatterers. For mesh nodes in vicinity of ends of the thin-strip scatterer, values of measuring function are very close for different metrons used. This will result in the ill-conditioned of MEI and MEI coefficients. In this paper, we will show this phenomena and our measurement for dealing with such problem. Numerical results are obtained to compare with those by Method of Moments.

AB - MEI has been applied to solve many kinds of electromagnetic radiation and scattering problems. In this paper concern MEI solution and singularity when it is used to analyze scattering problem of metallic thin-strip scatterers. In our analysis, a conformal mesh is employed. A 6-point MEI is used to find the truncation boundary condition. The singularity of MEI exists in the vicinity of ends of a two-dimensional thin-strip scatterers. For mesh nodes in vicinity of ends of the thin-strip scatterer, values of measuring function are very close for different metrons used. This will result in the ill-conditioned of MEI and MEI coefficients. In this paper, we will show this phenomena and our measurement for dealing with such problem. Numerical results are obtained to compare with those by Method of Moments.

UR - http://www.scopus.com/inward/record.url?scp=0031387815&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0031387815&origin=recordpage

U2 - 10.1109/APMC.1997.659426

DO - 10.1109/APMC.1997.659426

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 962-442-117-X

VL - 1

SP - 473

EP - 476

BT - Proceedings of 1997 Asia-Pacific Microwave Conference

PB - IEEE

T2 - 1997 Asia-Pacific Microwave Conference (APMC 97)

Y2 - 2 December 1997 through 5 December 1997

ER -

Analysis of thin-strip scatterer by MEI

Abstract

Conference

Access Output

Other Access Options

Permanent Link

Other Files and Links

Fingerprint

Cite this