Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

Thomas W. Pfeifer, Kan Ma, Nianhua Peng, Alexander Knowles, Jordan Hachtel, Eric R. Hoglund, Patrick E. Hopkins

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publication2024 Proceedings - Microscopy and Microanalysis
EditorsG. Celio, J. LeBeau, J. Evans, S. Spurgeon, N. Guy
PublisherOxford University Press
Pages1326-1327
DOIs
Publication statusPublished - Jul 2024
Externally publishedYes
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society (M&M 2024) - Cleveland, United States
Duration: 28 Jul 20241 Aug 2024

Publication series

NameMicroscopy and Microanalysis
NumberSupplement_1
Volume30
ISSN (Print)1431-9276

Conference

Conference82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society (M&M 2024)
PlaceUnited States
CityCleveland
Period28/07/241/08/24

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