Abstract
In modern manufacturing systems, the key performance indicators (KPIs) are defined as a set of metrics to reflect operation performance. The KPIs are not independent and may have intrinsic mutual relationships. In this paper, by categorizing such data into basic and comprehensive KPIs and supporting metrics, we introduce a hierarchical structure for identification and analysis of KPIs in manufacturing operation management, and use it to investigate pairwise relationship and dependencies between KPIs and supporting metrics. © 2015 IEEE.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2015 IEEE International Conference on Big Data, Big Data 2015 |
| Publisher | IEEE |
| Pages | 2767-2770 |
| ISBN (Print) | 9781479999255 |
| DOIs | |
| Publication status | Published - 22 Dec 2015 |
| Externally published | Yes |
| Event | 3rd IEEE International Conference on Big Data, Big Data 2015 - Santa Clara, United States Duration: 29 Oct 2015 → 1 Nov 2015 https://ieeexplore.ieee.org/xpl/conhome/7347101/proceeding |
Publication series
| Name | Proceedings - 2015 IEEE International Conference on Big Data, IEEE Big Data 2015 |
|---|
Conference
| Conference | 3rd IEEE International Conference on Big Data, Big Data 2015 |
|---|---|
| Place | United States |
| City | Santa Clara |
| Period | 29/10/15 → 1/11/15 |
| Internet address |
Bibliographical note
Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
-
SDG 7 Affordable and Clean Energy
-
SDG 9 Industry, Innovation, and Infrastructure
-
SDG 12 Responsible Consumption and Production
Research Keywords
- ISO 22400
- Key performance indicator (KPI)
- manufacturing operation management
Fingerprint
Dive into the research topics of 'Analysis of key operation performance data in manufacturing systems'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver