Analysis of ESD effect due to non-linearity of metallic enclosures
Research output: Journal Publications and Reviews › RGC 22 - Publication in policy or professional journal
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Pages (from-to) | 1260-1264 |
Journal / Publication | IEEE International Symposium on Electromagnetic Compatibility |
Volume | 2 |
Publication status | Published - 2001 |
Conference
Title | 2001 International Symposium on Electromagnetic Compatibility |
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Place | Canada |
City | Montrealm, Que. |
Period | 13 - 17 August 2001 |
Link(s)
Abstract
Electrostatic Discharge (BSD) is a problem in Electromagnetic Compatibility (EMC) that can lead to serious interruption of digital PCB circuit performance. This paper presents an analysis of the noise induced in the digital circuit and characterizes the BSD effect as the non-linear magnetic saturation property of metallic enclosures. The current distribution of the metallic enclosures is first evaluated, and the noise voltage induced in the PCB within the enclosed space is then estimated.
Citation Format(s)
Analysis of ESD effect due to non-linearity of metallic enclosures. / Fung, L. C.; Leung, S. W.; Chan, K. H.
In: IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, 2001, p. 1260-1264.
In: IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, 2001, p. 1260-1264.
Research output: Journal Publications and Reviews › RGC 22 - Publication in policy or professional journal