Analysis and Equivalent-Circuit Model for CMOS On-Chip Multiple Coupled Inductors in the Millimeter-Wave Region

Zongzhi Gao, Kai Kang*, Zhengdong Jiang, Yunqiu Wu, Chenxi Zhao, Yong-Lin Ban, Lingling Sun, Quan Xue, Wen-Yan Yin

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

42 Citations (Scopus)

Abstract

A growing number of on-chip inductors have been applied in the millimeter-wave IC design. The coupling effects between them have a negative impact on the performance of the circuit and each on-chip inductor. In this paper, a new equivalent-circuit model and a parameter extraction method for multiple on-chip inductors in the millimeter-wave region are proposed. The impacts of coupling effects on every on-chip inductor are comprehensive considered in the proposed parameter extraction method. The characteristics of the multiple on-chip-coupled inductors are analyzed, modeled, and measured. The test structures were fabricated by 0.18-μ m and 90-nm CMOS processes. The inductances, quality factors, and S-parameters of the model agree well with the measured performance of on-chip-nested and side-by-side-coupled inductors over a wide frequency range from 10 MHz up to millimeter-wave frequency band.
Original languageEnglish
Article number7312452
Pages (from-to)3957-3964
JournalIEEE Transactions on Electron Devices
Volume62
Issue number12
DOIs
Publication statusPublished - 1 Dec 2015

Research Keywords

  • CMOS
  • equivalent-circuit model
  • millimeter wave
  • multiple coupled inductors
  • nested coupled inductors.

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