Abstract
A growing number of on-chip inductors have been applied in the millimeter-wave IC design. The coupling effects between them have a negative impact on the performance of the circuit and each on-chip inductor. In this paper, a new equivalent-circuit model and a parameter extraction method for multiple on-chip inductors in the millimeter-wave region are proposed. The impacts of coupling effects on every on-chip inductor are comprehensive considered in the proposed parameter extraction method. The characteristics of the multiple on-chip-coupled inductors are analyzed, modeled, and measured. The test structures were fabricated by 0.18-μ m and 90-nm CMOS processes. The inductances, quality factors, and S-parameters of the model agree well with the measured performance of on-chip-nested and side-by-side-coupled inductors over a wide frequency range from 10 MHz up to millimeter-wave frequency band.
| Original language | English |
|---|---|
| Article number | 7312452 |
| Pages (from-to) | 3957-3964 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 62 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 1 Dec 2015 |
Research Keywords
- CMOS
- equivalent-circuit model
- millimeter wave
- multiple coupled inductors
- nested coupled inductors.
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