An investigation on electric field-induced microcracking and toughening in piezoelectric crystals

Z. Xu; Y. Zhang

doi:10.1002/9781118408476.ch11

An investigation on electric field-induced microcracking and toughening in piezoelectric crystals

Z. Xu
, Y. Zhang

Research output: Journal Publications and Reviews › RGC 22 - Publication in policy or professional journal

Abstract

Electric-field-induced microcracking and toughening in Pb(Mg _1/3Nb_2/3)O₃-PbTiO₃ piezoelectric single crystals during electrically cycling were investigated using in situ transmission electron microscopy (TEM). The crack growth was found to depend on both cycling field strength and cycle number. The deflection of microcrack caused by defect was observed. The toughening induced by domain switching and formation of new domains around microcrack tip to resist the crack growth was directly demonstrated.

Original language	English
Pages (from-to)	111-118
Journal	Ceramic Transactions
Volume	169
DOIs	https://doi.org/10.1002/9781118408476.ch11
Publication status	Published - 2005
Event	106th Annual Meeting of the American Ceramic Society - Indianapolis, United States Duration: 18 Apr 2004 → 21 Apr 2004

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title = "An investigation on electric field-induced microcracking and toughening in piezoelectric crystals",

abstract = "Electric-field-induced microcracking and toughening in Pb(Mg 1/3Nb2/3)O3-PbTiO3 piezoelectric single crystals during electrically cycling were investigated using in situ transmission electron microscopy (TEM). The crack growth was found to depend on both cycling field strength and cycle number. The deflection of microcrack caused by defect was observed. The toughening induced by domain switching and formation of new domains around microcrack tip to resist the crack growth was directly demonstrated.",

author = "Z. Xu and Y. Zhang",

year = "2005",

doi = "10.1002/9781118408476.ch11",

language = "English",

volume = "169",

pages = "111--118",

journal = "Ceramic Transactions",

issn = "1042-1122",

publisher = "Wiley-Blackwell",

note = "106th Annual Meeting of the American Ceramic Society ; Conference date: 18-04-2004 Through 21-04-2004",

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TY - JOUR

T1 - An investigation on electric field-induced microcracking and toughening in piezoelectric crystals

AU - Xu, Z.

AU - Zhang, Y.

PY - 2005

Y1 - 2005

N2 - Electric-field-induced microcracking and toughening in Pb(Mg 1/3Nb2/3)O3-PbTiO3 piezoelectric single crystals during electrically cycling were investigated using in situ transmission electron microscopy (TEM). The crack growth was found to depend on both cycling field strength and cycle number. The deflection of microcrack caused by defect was observed. The toughening induced by domain switching and formation of new domains around microcrack tip to resist the crack growth was directly demonstrated.

AB - Electric-field-induced microcracking and toughening in Pb(Mg 1/3Nb2/3)O3-PbTiO3 piezoelectric single crystals during electrically cycling were investigated using in situ transmission electron microscopy (TEM). The crack growth was found to depend on both cycling field strength and cycle number. The deflection of microcrack caused by defect was observed. The toughening induced by domain switching and formation of new domains around microcrack tip to resist the crack growth was directly demonstrated.

UR - https://www.scopus.com/pages/publications/23744459228

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-23744459228&origin=recordpage

U2 - 10.1002/9781118408476.ch11

DO - 10.1002/9781118408476.ch11

M3 - RGC 22 - Publication in policy or professional journal

SN - 1042-1122

VL - 169

SP - 111

EP - 118

JO - Ceramic Transactions

JF - Ceramic Transactions

T2 - 106th Annual Meeting of the American Ceramic Society

Y2 - 18 April 2004 through 21 April 2004

ER -

An investigation on electric field-induced microcracking and toughening in piezoelectric crystals

Abstract

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