TY - JOUR
T1 - An investigation of intermetallics formation between Pd/Ag metallization and Sn/Pb/Ag solder
AU - Li, G. Y.
AU - Chan, Y. C.
PY - 2002/9
Y1 - 2002/9
N2 - Intermetallics formation between metallization conductor Pd-Ag and solder 62Sn-36Pb-2Ag have been investigated by transmission electron microscopy (TEM) and X-Ray diffraction. Energy-dispersive X-Ray (EDX) analysis and Selected Area Electron Diffraction (SAED) analysis reveals the formation of the intermetallic compounds Ag5Sn, Ag3Sn, Pd2Sn, PdSn2, PdSn4, and PbPd3. X-Ray diffraction results confirm the coexistence of the above metallurgical phases and additional intermetallic compounds including Pd3Sn2, PdSn, and Pb3Pd5. Evident single phase intermetallic compound (IMC) layer structure is not observed. The different intermetallic phases coexist near the metallization/solder interface. Silver-tin intermetallic compounds are also observed in the solder.
AB - Intermetallics formation between metallization conductor Pd-Ag and solder 62Sn-36Pb-2Ag have been investigated by transmission electron microscopy (TEM) and X-Ray diffraction. Energy-dispersive X-Ray (EDX) analysis and Selected Area Electron Diffraction (SAED) analysis reveals the formation of the intermetallic compounds Ag5Sn, Ag3Sn, Pd2Sn, PdSn2, PdSn4, and PbPd3. X-Ray diffraction results confirm the coexistence of the above metallurgical phases and additional intermetallic compounds including Pd3Sn2, PdSn, and Pb3Pd5. Evident single phase intermetallic compound (IMC) layer structure is not observed. The different intermetallic phases coexist near the metallization/solder interface. Silver-tin intermetallic compounds are also observed in the solder.
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U2 - 10.1115/1.1486012
DO - 10.1115/1.1486012
M3 - RGC 21 - Publication in refereed journal
SN - 1043-7398
VL - 124
SP - 305
EP - 310
JO - Journal of Electronic Packaging, Transactions of the ASME
JF - Journal of Electronic Packaging, Transactions of the ASME
IS - 3
ER -