An incremental approach for model-based test suite reduction using Formal Concept Analysis

Pin Ng; Richard Y.K. Fung

doi:10.1109/ICUT.2009.5405725

An incremental approach for model-based test suite reduction using Formal Concept Analysis

Pin Ng
, Richard Y.K. Fung

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

1 Citation (Scopus)

Abstract

Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios with a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to incrementally determine a minimal set of test scenarios with adequate test coverage. © 2009 IEEE.

Original language	English
Title of host publication	Proceedings of the 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009
DOIs	https://doi.org/10.1109/ICUT.2009.5405725
Publication status	Published - 2009
Event	4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009 - Fukuoka, Japan Duration: 20 Dec 2009 → 22 Dec 2009

Conference

Conference	4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009
Place	Japan
City	Fukuoka
Period	20/12/09 → 22/12/09

Research Keywords

Formal concept analysis
Incremental test suite reduction
Model-based testing
State machine model

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10.1109/ICUT.2009.5405725

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title = "An incremental approach for model-based test suite reduction using Formal Concept Analysis",

abstract = "Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios with a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to incrementally determine a minimal set of test scenarios with adequate test coverage. {\textcopyright} 2009 IEEE.",

keywords = "Formal concept analysis, Incremental test suite reduction, Model-based testing, State machine model",

author = "Pin Ng and Fung, \{Richard Y.K.\}",

year = "2009",

doi = "10.1109/ICUT.2009.5405725",

language = "English",

isbn = "9781424451302",

booktitle = "Proceedings of the 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009",

note = "4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009 ; Conference date: 20-12-2009 Through 22-12-2009",

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Ng, P & Fung, RYK 2009, An incremental approach for model-based test suite reduction using Formal Concept Analysis. in Proceedings of the 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009., 5405725, 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009, Fukuoka, Japan, 20/12/09. https://doi.org/10.1109/ICUT.2009.5405725

An incremental approach for model-based test suite reduction using Formal Concept Analysis. / Ng, Pin; Fung, Richard Y.K.
Proceedings of the 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009. 2009. 5405725.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

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AU - Ng, Pin

AU - Fung, Richard Y.K.

PY - 2009

Y1 - 2009

N2 - Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios with a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to incrementally determine a minimal set of test scenarios with adequate test coverage. © 2009 IEEE.

AB - Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios with a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to incrementally determine a minimal set of test scenarios with adequate test coverage. © 2009 IEEE.

KW - Formal concept analysis

KW - Incremental test suite reduction

KW - Model-based testing

KW - State machine model

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DO - 10.1109/ICUT.2009.5405725

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 9781424451302

BT - Proceedings of the 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009

T2 - 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009

Y2 - 20 December 2009 through 22 December 2009

ER -

An incremental approach for model-based test suite reduction using Formal Concept Analysis

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