An asymmetric PI hysteresis model for piezoceramics in nanoscale AFM imaging

Dong Wang; Zaili Dong; Niandong Jiao; Shuai Yuan; Lei Zhou; Wen J. Li

doi:10.1109/NEMS.2011.6017543

An asymmetric PI hysteresis model for piezoceramics in nanoscale AFM imaging

Dong Wang
, Zaili Dong
, Niandong Jiao
, Shuai Yuan
, Lei Zhou
, Wen J. Li^*

^*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

17 Citations (Scopus)

Abstract

A modified Prandtl-Ishlinskii (PI) model, referred to as an asymmetric PI model, is implemented to reduce the displacement error between the model and the actual trajectory of a piezoceramic actuator used for AFM-based nanoscale imaging. The fact that the standard PI model is symmetric, while the actual hysteresis loop of a piezoceramic actuator is asymmetric, assures scanning errors if the standard PI operator is used. In order to improve the accuracy of the model, instead of using the same slope values in the entire PI model, different slope values to describe the forward loop (voltage increase) and the backward loop (voltage decrease) is proposed. The accuracy of the asymmetric PI model is validated on a custom-built AFM by comparing the experimental results derived from it with the results for the standard PI model. © 2011 IEEE.

Original language	English
Title of host publication	NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems
Pages	1075-1079
DOIs	https://doi.org/10.1109/NEMS.2011.6017543
Publication status	Published - 2011
Externally published	Yes
Event	6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011 - Kaohsiung, Taiwan, China Duration: 20 Feb 2011 → 23 Feb 2011

Conference

Conference	6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011
Place	Taiwan, China
City	Kaohsiung
Period	20/02/11 → 23/02/11

Research Keywords

AFM hysteresis
AFM imaging
nano-imaging
Nano-manipulation
piezo-actuator

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10.1109/NEMS.2011.6017543

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@inproceedings{31be8fce52e345f894d856cbbd359598,

title = "An asymmetric PI hysteresis model for piezoceramics in nanoscale AFM imaging",

abstract = "A modified Prandtl-Ishlinskii (PI) model, referred to as an asymmetric PI model, is implemented to reduce the displacement error between the model and the actual trajectory of a piezoceramic actuator used for AFM-based nanoscale imaging. The fact that the standard PI model is symmetric, while the actual hysteresis loop of a piezoceramic actuator is asymmetric, assures scanning errors if the standard PI operator is used. In order to improve the accuracy of the model, instead of using the same slope values in the entire PI model, different slope values to describe the forward loop (voltage increase) and the backward loop (voltage decrease) is proposed. The accuracy of the asymmetric PI model is validated on a custom-built AFM by comparing the experimental results derived from it with the results for the standard PI model. {\textcopyright} 2011 IEEE.",

keywords = "AFM hysteresis, AFM imaging, nano-imaging, Nano-manipulation, piezo-actuator",

author = "Dong Wang and Zaili Dong and Niandong Jiao and Shuai Yuan and Lei Zhou and Li, \{Wen J.\}",

year = "2011",

doi = "10.1109/NEMS.2011.6017543",

language = "English",

isbn = "9781612847757",

pages = "1075--1079",

booktitle = "NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems",

note = "6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011 ; Conference date: 20-02-2011 Through 23-02-2011",

}

Wang, D, Dong, Z, Jiao, N, Yuan, S, Zhou, L & Li, WJ 2011, An asymmetric PI hysteresis model for piezoceramics in nanoscale AFM imaging. in NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems., 6017543, pp. 1075-1079, 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, China, 20/02/11. https://doi.org/10.1109/NEMS.2011.6017543

An asymmetric PI hysteresis model for piezoceramics in nanoscale AFM imaging. / Wang, Dong; Dong, Zaili; Jiao, Niandong et al.
NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems. 2011. p. 1075-1079 6017543.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - An asymmetric PI hysteresis model for piezoceramics in nanoscale AFM imaging

AU - Wang, Dong

AU - Dong, Zaili

AU - Jiao, Niandong

AU - Yuan, Shuai

AU - Zhou, Lei

AU - Li, Wen J.

PY - 2011

Y1 - 2011

N2 - A modified Prandtl-Ishlinskii (PI) model, referred to as an asymmetric PI model, is implemented to reduce the displacement error between the model and the actual trajectory of a piezoceramic actuator used for AFM-based nanoscale imaging. The fact that the standard PI model is symmetric, while the actual hysteresis loop of a piezoceramic actuator is asymmetric, assures scanning errors if the standard PI operator is used. In order to improve the accuracy of the model, instead of using the same slope values in the entire PI model, different slope values to describe the forward loop (voltage increase) and the backward loop (voltage decrease) is proposed. The accuracy of the asymmetric PI model is validated on a custom-built AFM by comparing the experimental results derived from it with the results for the standard PI model. © 2011 IEEE.

AB - A modified Prandtl-Ishlinskii (PI) model, referred to as an asymmetric PI model, is implemented to reduce the displacement error between the model and the actual trajectory of a piezoceramic actuator used for AFM-based nanoscale imaging. The fact that the standard PI model is symmetric, while the actual hysteresis loop of a piezoceramic actuator is asymmetric, assures scanning errors if the standard PI operator is used. In order to improve the accuracy of the model, instead of using the same slope values in the entire PI model, different slope values to describe the forward loop (voltage increase) and the backward loop (voltage decrease) is proposed. The accuracy of the asymmetric PI model is validated on a custom-built AFM by comparing the experimental results derived from it with the results for the standard PI model. © 2011 IEEE.

KW - AFM hysteresis

KW - AFM imaging

KW - nano-imaging

KW - Nano-manipulation

KW - piezo-actuator

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U2 - 10.1109/NEMS.2011.6017543

DO - 10.1109/NEMS.2011.6017543

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 9781612847757

SP - 1075

EP - 1079

BT - NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems

T2 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011

Y2 - 20 February 2011 through 23 February 2011

ER -

An asymmetric PI hysteresis model for piezoceramics in nanoscale AFM imaging

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