An aluminum nitride on silicon resonant MEMS accelerometer operating in ambient pressure

Ming Yu Chao, Abid Ali, Sagnik Ghosh, Joshua E.-Y. Lee*

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

17 Citations (Scopus)

Abstract

We present an Aluminum Nitride (AlN) on Silicon (Si) resonant MEMS accelerometer with a calibrated differential sensitivity of 387 ppm/g measured in ambient conditions in air. This marks the highest figure of sensitivity among piezoelectric AlN-based resonant accelerometers reported to date by nearly an order of magnitude. The device is composed of a seismic mass attached to a pair of identical triple beam tuning forks (TBTFs) vibrating in an out-of-phase mode at a resonant frequency of 137.6 kHz.
Original languageEnglish
Title of host publicationTRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems
PublisherIEEE
Pages607-610
ISBN (Electronic)978-1-5386-2732-7
ISBN (Print)9781538627310
DOIs
Publication statusPublished - Jun 2017
Event19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017 - Kaohsiung Exhibition Center, Kaohsiung, Taiwan
Duration: 18 Jun 201722 Jun 2017
http://www.transducers2017.org/

Conference

Conference19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017
Abbreviated titleTRANSDUCERS 2017
Country/TerritoryTaiwan
CityKaohsiung
Period18/06/1722/06/17
Internet address

Research Keywords

  • Aluminum nitride-on-silicon
  • MEMS accelerometers
  • post-CMOS-compatible
  • resonant sensing

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