Abstract
We present an Aluminum Nitride (AlN) on Silicon (Si) resonant MEMS accelerometer with a calibrated differential sensitivity of 387 ppm/g measured in ambient conditions in air. This marks the highest figure of sensitivity among piezoelectric AlN-based resonant accelerometers reported to date by nearly an order of magnitude. The device is composed of a seismic mass attached to a pair of identical triple beam tuning forks (TBTFs) vibrating in an out-of-phase mode at a resonant frequency of 137.6 kHz.
Original language | English |
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Title of host publication | TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems |
Publisher | IEEE |
Pages | 607-610 |
ISBN (Electronic) | 978-1-5386-2732-7 |
ISBN (Print) | 9781538627310 |
DOIs | |
Publication status | Published - Jun 2017 |
Event | 19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017 - Kaohsiung Exhibition Center, Kaohsiung, Taiwan Duration: 18 Jun 2017 → 22 Jun 2017 http://www.transducers2017.org/ |
Conference
Conference | 19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017 |
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Abbreviated title | TRANSDUCERS 2017 |
Country/Territory | Taiwan |
City | Kaohsiung |
Period | 18/06/17 → 22/06/17 |
Internet address |
Research Keywords
- Aluminum nitride-on-silicon
- MEMS accelerometers
- post-CMOS-compatible
- resonant sensing