Al-Ni-Y-X (X = Cu, Ta, Zr) metallic glass composite thin films for broad-band uniform reflectivity

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journal

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)194-197
Journal / PublicationThin Solid Films
Volume571
Issue numberP1
Online published16 Oct 2014
Publication statusPublished - 28 Nov 2014
Externally publishedYes

Abstract

The Al-Ni-Y-X (X = Cu, Ta, Zr) thin film metallic glasses are manufactured by sputtering, and their optical reflectivity characteristics are explored. The relationship among composition, atomic structure and reflectivity performance is established. Compared with pure Al films, the Al-Ni-Y film surface roughness is much lower and hardness is much higher, more suitable for optical reflector applications. For composite Al-Ni-Y films, the reflectance varies within 80-91%. For fully amorphous films, the reflectivity exhibits unusual uniform reflection at ~70%, perfect for broad-band reflector.

Research Area(s)

  • Aluminum alloy, Metallic glass, Optical reflectivity, Optical reflector, Sputtering, Thin films