Al-induced fullerene-like nanostructures in C-Al-N thin films

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)2479-2482
Journal / PublicationMaterials Letters
Volume63
Issue number28
Publication statusPublished - 30 Nov 2009

Abstract

The role of aluminium incorporated into growing carbon nitride (CNx) films prepared by reactive dc-magnetron sputtering was investigated using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy and high-resolution transmission electron microscopy (HRTEM). XPS analyses revealed the formation of Al-N bonding besides C-C and C-N bonds. With increasing Al concentrations above 11.8 at.%, a structural transformation from essentially amorphous (a-) (CNx, AlN) phase to locally ordered microstructure comprising of fullerene-like (FL-) CNx nanostructures surrounded by a-(CNx, AlN) matrices was evidenced by Raman and HRTEM. The effect of aluminium in triggering FL-CNx nanostructures was elucidated from thermodynamic considerations. © 2009 Elsevier B.V. All rights reserved.

Research Area(s)

  • Aluminium, Carbon nitride, Fullerene-like, Magnetron sputtering, Thin films

Citation Format(s)

Al-induced fullerene-like nanostructures in C-Al-N thin films. / Han, Y. F.; Fu, T.; Shen, Y. G.

In: Materials Letters, Vol. 63, No. 28, 30.11.2009, p. 2479-2482.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review