Al-induced fullerene-like nanostructures in C-Al-N thin films
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 2479-2482 |
Journal / Publication | Materials Letters |
Volume | 63 |
Issue number | 28 |
Publication status | Published - 30 Nov 2009 |
Link(s)
Abstract
The role of aluminium incorporated into growing carbon nitride (CNx) films prepared by reactive dc-magnetron sputtering was investigated using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy and high-resolution transmission electron microscopy (HRTEM). XPS analyses revealed the formation of Al-N bonding besides C-C and C-N bonds. With increasing Al concentrations above 11.8 at.%, a structural transformation from essentially amorphous (a-) (CNx, AlN) phase to locally ordered microstructure comprising of fullerene-like (FL-) CNx nanostructures surrounded by a-(CNx, AlN) matrices was evidenced by Raman and HRTEM. The effect of aluminium in triggering FL-CNx nanostructures was elucidated from thermodynamic considerations. © 2009 Elsevier B.V. All rights reserved.
Research Area(s)
- Aluminium, Carbon nitride, Fullerene-like, Magnetron sputtering, Thin films
Citation Format(s)
Al-induced fullerene-like nanostructures in C-Al-N thin films. / Han, Y. F.; Fu, T.; Shen, Y. G.
In: Materials Letters, Vol. 63, No. 28, 30.11.2009, p. 2479-2482.
In: Materials Letters, Vol. 63, No. 28, 30.11.2009, p. 2479-2482.
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review