Abstract
This article reports on the measurement of the ion current in plasma immersion ion implantation. Our simulation results indicate that the total current peaks at the end of rise time of the applied voltage. However, our experimental data acquired using a Rogowski coil and digital oscillator show the highest current at the beginning of the voltage pulse. The discrepancy can be explained by a displacement current attributable to the changing voltage, sheath capacitance, circuit loading effects, as well as secondary electron emission. © 1999 American Institute of Physics.
| Original language | English |
|---|---|
| Pages (from-to) | 3567-3570 |
| Journal | Journal of Applied Physics |
| Volume | 86 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1 Oct 1999 |
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