Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Detail(s)

Original languageEnglish
Pages (from-to)903-914
Journal / PublicationJournal of Statistical Computation and Simulation
Volume80
Issue number8
Publication statusPublished - 2010

Abstract

This paper considers the design of accelerated life test (ALT) sampling plans under Type I progressive interval censoring with random removals. We assume that the lifetime of products follows a Weibull distribution. Two levels of constant stress higher than the use condition are used. The sample size and the acceptability constant that satisfy given levels of producer's risk and consumer's risk are found. In particular, the optimal stress level and the allocation proportion are obtained by minimizing the generalized asymptotic variance of the maximum likelihood estimators of the model parameters. Furthermore, for validation purposes, a Monte Carlo simulation is conducted to assess the true probability of acceptance for the derived sampling plans. © 2010 Taylor & Francis.

Research Area(s)

  • Accelerated life tests, Generalized asymptotic variance, Maximum likelihood estimation, Sampling plan, Type I progressive interval censoring

Citation Format(s)

Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals. / Ding, Chang; Yang, Chunyan; Tse, Siu-Keung.

In: Journal of Statistical Computation and Simulation, Vol. 80, No. 8, 2010, p. 903-914.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review