Above threshold pFET injection modeling intended for programmingfloating- gate systems

Paul Hasler; Arindam Basu; Scott Koziol

doi:10.1109/iscas.2007.378709

Author(s)

Paul Hasler
Arindam Basu
Scott Koziol

Detail(s)

Original language	English
Article number	4252949
Pages (from-to)	1557-1560
Journal / Publication	Proceedings - IEEE International Symposium on Circuits and Systems
Publication status	Published - 2007
Externally published	Yes

Conference

Title	2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007
Place	United States
City	New Orleans, LA
Period	27 - 30 May 2007

Link(s)

DOI	DOI https://doi.org/10.1109/iscas.2007.378709 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-34548834484&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(edc08312-a9f6-4959-b598-c2c8c5a3bfd3).html

Abstract

We present a first-order model for pFET hot-electron injection that is consistent for subthreshold and above threshold current levels. Injection is a critical phenomena for high-precision programming of floating-gate devices, and accurate modeling fuels continued improvement of programming techniques. Previous work has shown good modeling for subthreshold operation; in this work we extend the modeling throughout the region, enabling improved programming algorithms for floating-gate switch elements, resistors, and high-performance circuit elements. We discuss the implementation of this model in CADENCE'S version of SPICE. © 2007 IEEE.

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Citation Format(s)

[ RIS ] [ BibTeX ]

Above threshold pFET injection modeling intended for programmingfloating- gate systems. / Hasler, Paul; Basu, Arindam; Koziol, Scott.
In: Proceedings - IEEE International Symposium on Circuits and Systems, 2007, p. 1557-1560.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Hasler, P, Basu, A & Koziol, S 2007, 'Above threshold pFET injection modeling intended for programmingfloating- gate systems', Proceedings - IEEE International Symposium on Circuits and Systems, pp. 1557-1560. https://doi.org/10.1109/iscas.2007.378709

Hasler, P., Basu, A., & Koziol, S. (2007). Above threshold pFET injection modeling intended for programmingfloating- gate systems. Proceedings - IEEE International Symposium on Circuits and Systems, 1557-1560. Article 4252949. https://doi.org/10.1109/iscas.2007.378709

Hasler P, Basu A, Koziol S. Above threshold pFET injection modeling intended for programmingfloating- gate systems. Proceedings - IEEE International Symposium on Circuits and Systems. 2007;1557-1560. 4252949. doi: 10.1109/iscas.2007.378709

Hasler, Paul ; Basu, Arindam ; Koziol, Scott. / Above threshold pFET injection modeling intended for programmingfloating- gate systems. In: Proceedings - IEEE International Symposium on Circuits and Systems. 2007 ; pp. 1557-1560.