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A wear-leveling-aware dynamic stack for PCM memory in embedded systems

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Phase Change Memory (PCM) is a promising DRAM replacement in embedded systems due to its attractive characteristics such as extremely low leakage power, high storage density and good scalability. However, PCM's low endurance constrains its practical applications. In this paper, we propose a wear leveling aware dynamic stack to extend PCM's lifetime when it is adopted in embedded systems as main memory. Through a dynamic stack, the memory space is circularly allocated to stack frames, and thus an even usage of PCM memory is achieved. The experimental results show that the proposed method can significantly reduce the write variation on PCM cells and enhance the lifetime of PCM memory. © 2014 EDAA.
Original languageEnglish
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
PublisherIEEE
ISBN (Print)9783981537024
DOIs
Publication statusPublished - 2014
Event17th Design, Automation and Test in Europe, DATE 2014 - Dresden, Germany
Duration: 24 Mar 201428 Mar 2014

Publication series

Name
ISSN (Print)1530-1591

Conference

Conference17th Design, Automation and Test in Europe, DATE 2014
PlaceGermany
CityDresden
Period24/03/1428/03/14

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