A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production

K. N. Tu; A. M. Gusak

doi:10.1063/1.5111159

Author(s)

K. N. Tu
A. M. Gusak

Detail(s)

Original language	English
Article number	075109
Journal / Publication	Journal of Applied Physics
Volume	126
Issue number	7
Online published	16 Aug 2019
Publication status	Published - 21 Aug 2019
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1063/1.5111159 Final Published version
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Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-85071048517&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(141c8755-6646-4292-9d1c-22941495bbc8).html

Abstract

We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given.

Citation Format(s)

[ RIS ] [ BibTeX ]

A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production. / Tu, K. N.; Gusak, A. M.
In: Journal of Applied Physics, Vol. 126, No. 7, 075109, 21.08.2019.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Tu, KN & Gusak, AM 2019, 'A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production', Journal of Applied Physics, vol. 126, no. 7, 075109. https://doi.org/10.1063/1.5111159

Tu, K. N., & Gusak, A. M. (2019). A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production. Journal of Applied Physics, 126(7), Article 075109. https://doi.org/10.1063/1.5111159

Tu KN, Gusak AM. A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production. Journal of Applied Physics. 2019 Aug 21;126(7):075109. Epub 2019 Aug 16. doi: 10.1063/1.5111159

Tu, K. N. ; Gusak, A. M. / A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production. In: Journal of Applied Physics. 2019 ; Vol. 126, No. 7.