TY - JOUR
T1 - A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production
AU - Tu, K. N.
AU - Gusak, A. M.
PY - 2019/8/21
Y1 - 2019/8/21
N2 - We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given.
AB - We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given.
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U2 - 10.1063/1.5111159
DO - 10.1063/1.5111159
M3 - RGC 21 - Publication in refereed journal
SN - 0021-8979
VL - 126
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 7
M1 - 075109
ER -