A Statistics-Based Sensor Selection Scheme for Continuous Probabilistic Queries in Sensor Networks

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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Detail(s)

Original languageEnglish
Title of host publicationProceedings - 11th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications
Pages331-336
Publication statusPublished - Aug 2005

Publication series

Name
ISSN (Print)1533-2306

Conference

Title11th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA 2005)
PlaceChina
CityHong Kong
Period17 - 19 August 2005

Abstract

An approach to improve the reliability of query results based on error-prone sensors is to use redundant sensors. However, this approach is expensive; moreover, some sensors may malfunction and their readings need to be discarded. In this paper, we propose a statistical approach to decide which sensors to be used to answer a query. In particular, we propose to solve the problem with the aid of continuous probabilistic query (CPQ), which is originally used to manage uncertain data and is associated with a probabilistic guarantee on the query result. Based on the historical data values from the sensors, the query type, and the requirement on the query, we present methods to select an appropriate set of sensors and provide reliable answers for aggregate queries. Our algorithm is demonstrated in simulation experiments to provide accurate and robust query results.

Citation Format(s)

A Statistics-Based Sensor Selection Scheme for Continuous Probabilistic Queries in Sensor Networks. / Han, Song; Chan, Edward; Cheng, Reynold; Lam, Kam-Yiu.

Proceedings - 11th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications. 2005. p. 331-336 1541103.

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review